Singh, D. P. (2023) Application of Thin Layer Activation to Determine Surface Degradation in Various Materials. In: Current Perspective to Physical Science Research Vol. 3. B P International, pp. 221-232. ISBN 978-81-967636-5-7
Full text not available from this repository.Abstract
Thin Layer Activation is nuclear measurement technique which can be employed to determine surface degradation in various materials by choosing appropriate ion beams in industries of strategic importance due to its high sensitivity, precision & reliable results. In the present research work, attempt has been made to find correlation and systematic between projectile mass and linear activity using different beams viz; proton, deuteron, 3He and Alpha and linear activity induced in materials like Aluminium, Iron& Nickel have been reported in almost same energy region. In the present work, an attempt has been made to investigate the influence of various ion beams on linear activity induced different materials. A number of nuclear reactions have been studied for exploring influence of linear activity in studied materials which are of great importance from industrial applications in various sectors.
Item Type: | Book Section |
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Subjects: | GO for ARCHIVE > Physics and Astronomy |
Depositing User: | Unnamed user with email support@goforarchive.com |
Date Deposited: | 03 Jan 2024 04:22 |
Last Modified: | 03 Jan 2024 04:22 |
URI: | http://eprints.go4mailburst.com/id/eprint/2051 |